• DocumentCode
    1097330
  • Title

    Extended measurements of gallium arsenide breakdown characteristics using punchthrough structures

  • Author

    Baliga, B.J. ; Sears, A.R. ; Menditto, P. ; Campbell, P.M.

  • Author_Institution
    General Electric Company, Schenectady, NY
  • Volume
    5
  • Issue
    9
  • fYear
    1984
  • fDate
    9/1/1984 12:00:00 AM
  • Firstpage
    385
  • Lastpage
    387
  • Abstract
    Measurements of the avalanche breakdown characteristics of gallium arsenide have been extended to carrier concentrations below 1015per cm3by using punchthrough structures. Although the earlier measured values [7] at doping levels above 1015per cm3were in close agreement with the theoretical calculations by Lee and Sze [6], the measurements performed in this study at lower doping indicate an overestimation of the breakdown voltage by about 30 percent by the theoretical analysis.
  • Keywords
    Atomic measurements; Avalanche breakdown; Breakdown voltage; Doping; Electric breakdown; Epitaxial growth; Epitaxial layers; Gallium arsenide; Schottky diodes; Substrates;
  • fLanguage
    English
  • Journal_Title
    Electron Device Letters, IEEE
  • Publisher
    ieee
  • ISSN
    0741-3106
  • Type

    jour

  • DOI
    10.1109/EDL.1984.25955
  • Filename
    1484331