DocumentCode
1097330
Title
Extended measurements of gallium arsenide breakdown characteristics using punchthrough structures
Author
Baliga, B.J. ; Sears, A.R. ; Menditto, P. ; Campbell, P.M.
Author_Institution
General Electric Company, Schenectady, NY
Volume
5
Issue
9
fYear
1984
fDate
9/1/1984 12:00:00 AM
Firstpage
385
Lastpage
387
Abstract
Measurements of the avalanche breakdown characteristics of gallium arsenide have been extended to carrier concentrations below 1015per cm3by using punchthrough structures. Although the earlier measured values [7] at doping levels above 1015per cm3were in close agreement with the theoretical calculations by Lee and Sze [6], the measurements performed in this study at lower doping indicate an overestimation of the breakdown voltage by about 30 percent by the theoretical analysis.
Keywords
Atomic measurements; Avalanche breakdown; Breakdown voltage; Doping; Electric breakdown; Epitaxial growth; Epitaxial layers; Gallium arsenide; Schottky diodes; Substrates;
fLanguage
English
Journal_Title
Electron Device Letters, IEEE
Publisher
ieee
ISSN
0741-3106
Type
jour
DOI
10.1109/EDL.1984.25955
Filename
1484331
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