Testing of a Resistive Fault Current Limiter Component Based on Bi-2212 Bifilar Coil

Author

Polasek, A. ; Sena, C.V. ; Dias, R. ; Serra, E.T. ; Rizzo, F.C.

Author_Institution

CEPEL-Electr. Power Res. Center, Rio de Janeiro, Brazil

Volume

19

Issue

3

fYear

2009

fDate

6/1/2009 12:00:00 AM

Firstpage

1823

Lastpage

1826

Abstract

A shunted bulk Bi-2212 bifilar coil was cooled with liquid nitrogen (77 K) and subjected to controlled fault current tests. Prospective currents achieving 11 kA were limited to about 5 kA (first peak) and to 3 kA (following peaks), under 200-300 V. The Bi-2212 coil was able to withstand several short circuits, showing a fast response and reproducible results. A recovery time of minutes was needed between two successive tests. Therefore, the bulk coil was damaged when the interval between subsequent short-circuits was reduced to 30-60 seconds. The critical current was severely reduced by those last tests and further thermal shock. The bulk coil was cut in transversal and longitudinal sections, in order to evaluate the damages.

Keywords

coils; fault current limiters; short-circuit currents; testing; thermal shock; current 11 kA; current 3 kA; current 5 kA; fault current test; resistive fault current limiter component testing; short circuit current; shunted bulk Bi-2212 bifilar coil; thermal shock; time 30 s to 60 s; voltage 200 V to 300 V; Bi-2212; Bifilar coil; bulk; fault current limiter;

fLanguage

English

Journal_Title

Applied Superconductivity, IEEE Transactions on

Publisher

ieee

ISSN

1051-8223

Type

jour

DOI

10.1109/TASC.2009.2017753

Filename

5109531