DocumentCode :
1097654
Title :
Efficient Discrete-Time Bandpass Sigma-Delta Modulator and Digital I/Q Demodulator for Multistandard Wireless Applications
Author :
Jeong, Chanyong ; Kim, Yonghwan ; Kim, Soowon
Author_Institution :
Samsung Electro-Mech. Co. Ltd., Suwon
Volume :
54
Issue :
1
fYear :
2008
fDate :
2/1/2008 12:00:00 AM
Firstpage :
25
Lastpage :
32
Abstract :
This paper presents an efficient discrete-time bandpass sigma-delta (SigmaDelta) modulator and digital in-phase /quadrature (1/Q) demodulator for multistandard wireless applications. The proposed bandpass SigmaDelta modulator provides higher speed using advanced switched-capacitor resonators which are faster than the conventional ones. The test chip has been implemented in a 0.18 mum CMOS process and occupied with the active chip area ofO. 16 mm2. The power consumption of the fabricated chip is 2.34 mW with a 1.8 V supply voltage. The measured peak signal-to-noise ratios (SNR) are 34 dB for 1.536 MHz (T-DMB), 26 dB for 5 MHz (UMTS), and 20 dB for 10 MHz (WiBro) bandwidths, respectively. This paper also covers the simple and robust digital I/Q demodulator which has been realized using a field programmable gate array (FPGA) for digital signal processing.
Keywords :
3G mobile communication; CMOS integrated circuits; broadband networks; demodulators; mobile radio; modulators; radio broadcasting; resonators; CMOS process; FPGA; SNR; T-DMB; UMTS; WiBro; bandwidth 1.536 MHz; bandwidth 10 MHz; bandwidth 5 MHz; digital I-Q demodulator; digital in-phase-quadrature demodulator; discrete-time bandpass sigma-delta modulator; field programmable gate array; power 2.34 mW; signal-to-noise ratios; size 0.18 mum; switched-capacitor resonators; voltage 1.8 V; CMOS process; Delta-sigma modulation; Demodulation; Digital modulation; Energy consumption; Field programmable gate arrays; PSNR; Semiconductor device measurement; Testing; Voltage measurement;
fLanguage :
English
Journal_Title :
Consumer Electronics, IEEE Transactions on
Publisher :
ieee
ISSN :
0098-3063
Type :
jour
DOI :
10.1109/TCE.2008.4470019
Filename :
4470019
Link To Document :
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