DocumentCode :
1097894
Title :
VELA: The CMOS Circuit Based on Fast Current Read-Out for X-Ray Spectroscopy With DePMOS
Author :
Bombelli, Luca ; Fiorini, Carlo ; Porro, Matteo ; Herrmann, Sven ; Wölfel, Stefan
Author_Institution :
Politecnico di Milano, Milano
Volume :
54
Issue :
4
fYear :
2007
Firstpage :
1359
Lastpage :
1366
Abstract :
DePMOS based active pixel sensor (APS) matrix is a new detector concept for X-ray imaging and spectroscopy applications. This type of X-ray detector can provide excellent energy resolution and high-speed readout. Both these features and the advantage of random pixel accessibility can fulfill the requirements of new space applications, like the XEUS wide field imager. In a matrix arrangement, each pixel must be read out by a time variant filter, so a new readout mechanism and a proper multi-channel integrated shaping amplifier are needed. To operate at the required fast processing time (e.g., 4 per line) DePMOS transistor cannot be operated in the classical source follower configuration, because this results in a long settling time. So a new design for multi-channel readout of the DePMOS matrix has to be considered. We propose a new fast readout concept, which is based on the DePMOS drain current readout and processing.
Keywords :
CMOS integrated circuits; X-ray apparatus; X-ray imaging; X-ray spectroscopy; nuclear electronics; position sensitive particle detectors; readout electronics; semiconductor counters; CMOS circuit; DePMOS; DePMOS transistor; VELA; X-ray detector; X-ray evolving universe spectroscopy; X-ray imaging; X-ray spectroscopy; XEUS wide field imager; active pixel sensor matrix; current readout; multichannel integrated shaping amplifier; source follower configuration; CMOS image sensors; Circuits; Energy resolution; Filters; Image sensors; Pixel; Spectroscopy; X-ray detection; X-ray detectors; X-ray imaging; Current readout; DePMOS; fast weighting functions; time-variant filter;
fLanguage :
English
Journal_Title :
Nuclear Science, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9499
Type :
jour
DOI :
10.1109/TNS.2007.901224
Filename :
4291691
Link To Document :
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