• DocumentCode
    1098187
  • Title

    A Statistical Method to Extract MBU Without Scrambling Information

  • Author

    Falguére, Didier ; Petit, Sophie

  • Author_Institution
    ONERA-DESP, Toulouse
  • Volume
    54
  • Issue
    4
  • fYear
    2007
  • Firstpage
    920
  • Lastpage
    923
  • Abstract
    This paper reports on a new method for extracting MBUs from standard SEE data without the need for the physical organisation of the memories. Efficiency of the method proposed here is quantified through a reduced set of parameters.
  • Keywords
    SRAM chips; statistical analysis; SRAM; multiple bit upset; statistical method; Data mining; Error correction codes; Helium; Laser theory; Protons; Random access memory; Reverse engineering; Single event upset; Statistical analysis; Testing; Multiple bit upset (MBU); SRAM; single event upset (SEU);
  • fLanguage
    English
  • Journal_Title
    Nuclear Science, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9499
  • Type

    jour

  • DOI
    10.1109/TNS.2007.903178
  • Filename
    4291720
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=1098187