DocumentCode :
1098224
Title :
Magnetic-Multilayered Interconnects Featuring Skin Effect Suppression
Author :
Zhuang, Yan ; Rejaei, B. ; Schellevis, H. ; Vroubel, M. ; Burghartz, J.N.
Author_Institution :
Delft Univ. of Technol., Delft
Volume :
29
Issue :
4
fYear :
2008
fDate :
4/1/2008 12:00:00 AM
Firstpage :
319
Lastpage :
321
Abstract :
A novel concept for a high-frequency, low-loss interconnect with significant skin effect suppression over a wide frequency band is presented. The concept is based on a multilayer comprising thin magnetic (Ni80Fe20) and metal (Cu) layers. The negative permeability of the magnetic layers leads to a near-cancellation of the overall permeability of the multilayer stack. This results in a significant increase of skin depth and thus, a more uniform distribution of the current density and a dramatic reduction of loss within a certain frequency range. Coplanar waveguides built using the multilayer technology show more than 50% loss reduction at 14 GHz compared to their thick Cu-based counterparts.
Keywords :
coplanar waveguides; copper; integrated circuit interconnections; iron compounds; magnetic permeability; nickel compounds; Ni80Fe20; coplanar waveguides; magnetic layers; magnetic-multilayered interconnects; metal layers; multilayer stack; negative permeability; skin effect suppression; Interconnections; magnetic layered films; magnetic resonance; microwave technology; transmission lines;
fLanguage :
English
Journal_Title :
Electron Device Letters, IEEE
Publisher :
ieee
ISSN :
0741-3106
Type :
jour
DOI :
10.1109/LED.2008.917630
Filename :
4470162
Link To Document :
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