Title :
Deep Traps Induced by 700 keV Protons in CdTe and CdZnTe Detectors
Author :
Fraboni, Beatrice ; Cavallini, Anna ; Auricchio, Natalia ; Bianconi, Marco
Author_Institution :
Bologna Univ., Bologna
Abstract :
We have studied the effects of 700 keV protons at increasing fluences (up to 2times1012 p/cm2) on CdTe:Cl and Cd0.9Zn0.1Te detectors. The charge transport properties of the detectors have been studied by mobility-lifetime (mutau) product measurements, gamma spectroscopy and photo induced current transient spectroscopy (PICTS) analyses. The correlation of the macroscopic transport behaviour with the information on the microscopic defective states allowed for the identification of the role played by the dominant traps: levels Z and H1 resulted related to electron trapping effects, while levels K and X showed a hole trapping character.
Keywords :
deep levels; electron mobility; electron traps; gamma-ray spectra; hole traps; proton effects; semiconductor counters; Cd0.9Zn0.1Te detectors; CdTe:Cl detectors; PICTS; charge transport properties; deep levels; electron trapping effects; gamma spectroscopy; hole trapping; macroscopic transport behaviour; mobility-lifetime product; photo induced current transient spectroscopy; proton irradiation; Charge measurement; Current measurement; Electron traps; Gamma ray detection; Gamma ray detectors; Protons; Spectroscopy; Tellurium; Transient analysis; Zinc; Charge carrier transport; deep levels; mobility-lifetime product; radiation effects; room temperature detectors;
Journal_Title :
Nuclear Science, IEEE Transactions on
DOI :
10.1109/TNS.2007.902364
