• DocumentCode
    1098332
  • Title

    A new vertical power MOSFET structure with extremely reduced on-resistance

  • Author

    Ueda, Daisuke ; Takagi, Hiromitsu ; Kano, Gota

  • Author_Institution
    Matsushita Electronics Corporation, Takatsuki, Osaka, Japan
  • Volume
    32
  • Issue
    1
  • fYear
    1985
  • fDate
    1/1/1985 12:00:00 AM
  • Firstpage
    2
  • Lastpage
    6
  • Abstract
    A new vertical power MOSFET structure called rectangular-grooved MOSFET (RMOS) is proposed, in which the vertical channels are provided along the sidewalls of the rectangular grooves formed by a reactive ion-beam etching (RIBE) technique. The structure is characterized by reduced ON-resistance and high packing density. The relationship between the ON-resistance and the packing density in the new structure is calculated. It is demonstrated that the structure essentially possesses a lower ON-resistance per unit area than VMOS and DMOS structures. Experimental results are also described in detail.
  • Keywords
    Automatic logic units; Bipolar transistors; Circuit stability; Electron mobility; Etching; Impedance; MOSFET circuits; Power MOSFET; Region 6; Thermal stability;
  • fLanguage
    English
  • Journal_Title
    Electron Devices, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9383
  • Type

    jour

  • DOI
    10.1109/T-ED.1985.21900
  • Filename
    1484647