DocumentCode
1098430
Title
Single-gate charge-injection device readout modeling and analysis
Author
Wang, Samuel C H ; Winn, Michael L.
Author_Institution
General Electric Company, Syracuse, NY
Volume
32
Issue
1
fYear
1985
fDate
1/1/1985 12:00:00 AM
Firstpage
55
Lastpage
60
Abstract
An in-depth performance analysis of the single-gate charge-injection device (CID) based on a piecewise linear charge-voltage (Q-V) model is presented. Both the voltage- and the current-type readout techniques with sequential access scheme for the linear CID arrays are considered. Heuristic views on CID charge readout efficiency degradation due to depletion loading and lag caused by injection pulse loading are illustrated. Transient and steady-state characteristics of the detector are demonstrated by a step-function response. Performance parameters of the CID array as an infrared sensor are summarized and compared to evaluate the relative merits of each readout scheme.
Keywords
Capacitors; Charge coupled devices; Infrared sensors; Performance analysis; Piecewise linear techniques; Pulse amplifiers; Sensor arrays; Switches; Timing; Voltage;
fLanguage
English
Journal_Title
Electron Devices, IEEE Transactions on
Publisher
ieee
ISSN
0018-9383
Type
jour
DOI
10.1109/T-ED.1985.21909
Filename
1484656
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