DocumentCode :
1098430
Title :
Single-gate charge-injection device readout modeling and analysis
Author :
Wang, Samuel C H ; Winn, Michael L.
Author_Institution :
General Electric Company, Syracuse, NY
Volume :
32
Issue :
1
fYear :
1985
fDate :
1/1/1985 12:00:00 AM
Firstpage :
55
Lastpage :
60
Abstract :
An in-depth performance analysis of the single-gate charge-injection device (CID) based on a piecewise linear charge-voltage (Q-V) model is presented. Both the voltage- and the current-type readout techniques with sequential access scheme for the linear CID arrays are considered. Heuristic views on CID charge readout efficiency degradation due to depletion loading and lag caused by injection pulse loading are illustrated. Transient and steady-state characteristics of the detector are demonstrated by a step-function response. Performance parameters of the CID array as an infrared sensor are summarized and compared to evaluate the relative merits of each readout scheme.
Keywords :
Capacitors; Charge coupled devices; Infrared sensors; Performance analysis; Piecewise linear techniques; Pulse amplifiers; Sensor arrays; Switches; Timing; Voltage;
fLanguage :
English
Journal_Title :
Electron Devices, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9383
Type :
jour
DOI :
10.1109/T-ED.1985.21909
Filename :
1484656
Link To Document :
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