• DocumentCode
    1098430
  • Title

    Single-gate charge-injection device readout modeling and analysis

  • Author

    Wang, Samuel C H ; Winn, Michael L.

  • Author_Institution
    General Electric Company, Syracuse, NY
  • Volume
    32
  • Issue
    1
  • fYear
    1985
  • fDate
    1/1/1985 12:00:00 AM
  • Firstpage
    55
  • Lastpage
    60
  • Abstract
    An in-depth performance analysis of the single-gate charge-injection device (CID) based on a piecewise linear charge-voltage (Q-V) model is presented. Both the voltage- and the current-type readout techniques with sequential access scheme for the linear CID arrays are considered. Heuristic views on CID charge readout efficiency degradation due to depletion loading and lag caused by injection pulse loading are illustrated. Transient and steady-state characteristics of the detector are demonstrated by a step-function response. Performance parameters of the CID array as an infrared sensor are summarized and compared to evaluate the relative merits of each readout scheme.
  • Keywords
    Capacitors; Charge coupled devices; Infrared sensors; Performance analysis; Piecewise linear techniques; Pulse amplifiers; Sensor arrays; Switches; Timing; Voltage;
  • fLanguage
    English
  • Journal_Title
    Electron Devices, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9383
  • Type

    jour

  • DOI
    10.1109/T-ED.1985.21909
  • Filename
    1484656