• DocumentCode
    1098773
  • Title

    An empirical study of the simulation of various models used for images

  • Author

    Gray, A.J. ; Kay, J.W. ; Titterington, D.M.

  • Author_Institution
    Dept. of Stat. & Modelling Sci., Strathclyde Univ., Glasgow, UK
  • Volume
    16
  • Issue
    5
  • fYear
    1994
  • fDate
    5/1/1994 12:00:00 AM
  • Firstpage
    507
  • Lastpage
    513
  • Abstract
    Markov random fields are typically used as priors in Bayesian image restoration methods to represent spatial information in the image. Commonly used Markov random fields are not in fact capable of representing the moderate-to-large scale clustering present in naturally occurring images and can also be time consuming to simulate, requiring iterative algorithms which can take hundreds of thousands of sweeps of the image to converge. Markov mesh models, a causal subclass of Markov random fields, are, however, readily simulated. We describe an empirical study of simulated realizations from various models used in the literature, and we introduce some new mesh-type models. We conclude, however, that while large-scale clustering may be represented by such models, strong directional effects are also present for all but very limited parameterizations. It is emphasized that the results do not detract from the use of Markov random fields as representers of local spatial properties, which is their main purpose in the implementation of Bayesian statistical approaches to image analysis. Brief allusion is made to the issue of parameter estimation
  • Keywords
    Bayes methods; Markov processes; image reconstruction; Bayesian image restoration methods; Markov mesh models; Markov random fields; iterative algorithms; moderate-to-large scale clustering; parameter estimation; strong directional effects; Additive noise; Bayesian methods; Gaussian noise; Image converters; Image restoration; Iterative algorithms; Large-scale systems; Markov random fields; Parameter estimation; Statistics;
  • fLanguage
    English
  • Journal_Title
    Pattern Analysis and Machine Intelligence, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0162-8828
  • Type

    jour

  • DOI
    10.1109/34.291447
  • Filename
    291447