DocumentCode :
1098876
Title :
New Protection Techniques Against SEUs for Moving Average Filters in a Radiation Environment
Author :
Reyes, P. ; Reviriego, P. ; Maestro, J.A. ; Ruano, O.
Author_Institution :
Univ. Antonio de Nebrija, Madrid
Volume :
54
Issue :
4
fYear :
2007
Firstpage :
957
Lastpage :
964
Abstract :
Single event effects (SEEs) caused by radiation are a major concern when working with circuits that need to operate in certain environments, like for example in space applications. In this paper, new techniques for the implementation of moving average filters that provide protection against SEEs are presented, which have a lower circuit complexity and cost than traditional techniques like triple modular redundancy (TMR). The effectiveness of these techniques has been evaluated using a software fault injection platform and the circuits have been synthesized for a commercial library in order to assess their complexity. The main idea behind the presented approach is to exploit the structure of moving average filter implementations to deal with SEEs at a higher level of abstraction.
Keywords :
circuit complexity; digital filters; integrated circuit testing; integrated circuits; radiation hardening (electronics); redundancy; circuit complexity; digital filters; microelectronic circuits; moving average filter implementation; protection techniques; radiation effects; radiation environment; radiation hardening; redundancy; single event effects; single event upsets; software fault injection platform; Application software; Circuit faults; Circuit synthesis; Complexity theory; Costs; Filters; Protection; Redundancy; Single event transient; Software libraries; Digital filters; Single Event Upsets (SEUs); radiation hardening; redundancy;
fLanguage :
English
Journal_Title :
Nuclear Science, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9499
Type :
jour
DOI :
10.1109/TNS.2007.892118
Filename :
4291783
Link To Document :
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