DocumentCode :
1098936
Title :
Hot-electron substrate-current generation during switching transients
Author :
Hsu, Fu-Chieh ; Chiu, Kuang Yi
Author_Institution :
Hewlett-Packard Laboratories, Palo Alto, CA
Volume :
32
Issue :
2
fYear :
1985
fDate :
2/1/1985 12:00:00 AM
Firstpage :
394
Lastpage :
399
Abstract :
The characteristics of hot-electron substrate-current generation in n-channel MOSFET´s during switching transients of an inverter are studied. The amount of substrate current generated depends strongly on the loading and the input transition time (switching speed) of the inverter. Most circuit elements including inverters, source followers, and transfer gates have similar behaviors in transient substrate-current generation. An analytical model is proposed to calculate the substrate-current generation with various supply voltages and input transition times. This model not only establishes the relationship between dc and transient substrate-current measurements, but also serves as a useful tool in predicting circuit/device reliability during actual circuit operations.
Keywords :
Analytical models; Character generation; Circuits; Degradation; Electric breakdown; Inverters; Predictive models; Threshold voltage; Transient analysis; Vents;
fLanguage :
English
Journal_Title :
Electron Devices, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9383
Type :
jour
DOI :
10.1109/T-ED.1985.21954
Filename :
1484701
Link To Document :
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