DocumentCode
1098953
Title
Automatic frequency control in a semiconductor laser and an optical amplifier
Author
Kobayashi, Soichi ; Kimura, Tatsuya
Author_Institution
NTT Public Corporation, Masashinoshi, Tokyo, Japan
Volume
1
Issue
2
fYear
1983
fDate
6/1/1983 12:00:00 AM
Firstpage
394
Lastpage
402
Abstract
Automatic frequency control (AFC) in an injection locked or resonant type amplifier in an AlGaAs semiconductor laser was achieved through using the terminal voltage change induced by light injection. Signal-to-noise ratio in the control signal of 10 dB was obtained when the input optical power was -47 dBm and the optical gain Was 51 dB. The AFC was maintained for 3 h with an 0.3-percent output power fluctuation for 2°C ambient temperature change and 65-MHz frequency stability. Step response showed that the system response time was 1.5 s. Sensitivity to input optical power deteriorates at -49 dBm, with a 53-dB locking gain, because of frequency deviation caused by temperature modulation. The second derivative of the induced voltage and it\´s relation to the optical frequency is constant at
[V/(MHz)2] for all input power levels in a buried-heterostructure (BH)-AlGaAs laser. Terminal voltage change induced by light injection is calculated by simple rate equations with a Gaussian-Halperin-Lax (GHL) bandtail model. Good agreement with experimental results was seen.
[V/(MHz)2] for all input power levels in a buried-heterostructure (BH)-AlGaAs laser. Terminal voltage change induced by light injection is calculated by simple rate equations with a Gaussian-Halperin-Lax (GHL) bandtail model. Good agreement with experimental results was seen.Keywords
Frequency control; Gallium materials/lasers; Injection-locked oscillators; Laser amplifiers; Resonant-transfer circuits; Automatic frequency control; Optical control; Optical modulation; Optical sensors; Optical variables control; Semiconductor lasers; Semiconductor optical amplifiers; Stimulated emission; Temperature sensors; Voltage;
fLanguage
English
Journal_Title
Lightwave Technology, Journal of
Publisher
ieee
ISSN
0733-8724
Type
jour
DOI
10.1109/JLT.1983.1072112
Filename
1072112
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