Title :
Error-corrected two-stage unidirectional network analyser
Author :
Eul, H.J. ; Schiek, B.
Author_Institution :
Ruhr-Univ., Bochum, West Germany
fDate :
9/15/1988 12:00:00 AM
Abstract :
A simple and easy to implement network analyser is presented which allows the measurement of all scattering parameters of an unknown device under test without the necessity of reversing it. Furthermore this network analyser can be calibrated with lower and more practicable calibration standards than comparable systems in common use. A mathematical description is presented to allow for the application of TSD or TAN calibration techniques
Keywords :
S-parameters; network analysers; TAN; TSD; calibration standards; scattering parameters; two-stage unidirectional network analyser; unknown device under test;
Journal_Title :
Electronics Letters
