• DocumentCode
    1099036
  • Title

    Error-corrected two-stage unidirectional network analyser

  • Author

    Eul, H.J. ; Schiek, B.

  • Author_Institution
    Ruhr-Univ., Bochum, West Germany
  • Volume
    24
  • Issue
    19
  • fYear
    1988
  • fDate
    9/15/1988 12:00:00 AM
  • Firstpage
    1197
  • Lastpage
    1198
  • Abstract
    A simple and easy to implement network analyser is presented which allows the measurement of all scattering parameters of an unknown device under test without the necessity of reversing it. Furthermore this network analyser can be calibrated with lower and more practicable calibration standards than comparable systems in common use. A mathematical description is presented to allow for the application of TSD or TAN calibration techniques
  • Keywords
    S-parameters; network analysers; TAN; TSD; calibration standards; scattering parameters; two-stage unidirectional network analyser; unknown device under test;
  • fLanguage
    English
  • Journal_Title
    Electronics Letters
  • Publisher
    iet
  • ISSN
    0013-5194
  • Type

    jour

  • Filename
    29154