DocumentCode
1099097
Title
A 10K-gate CMOS gate array based on a gate isolation structure
Author
Sakashita, Kazuhiro ; Ueda, Masahiro ; Arakawa, Takahiko ; Asai, Sotoju ; Fujimura, Tatsuo ; Ohkura, Isao
Author_Institution
Mitsubishi Electric Corporation, Itami, Japan
Volume
32
Issue
2
fYear
1985
fDate
2/1/1985 12:00:00 AM
Firstpage
493
Lastpage
497
Abstract
This paper describes an effect of the "gate isolation" technique and its application to a 10K-gate CMOS gate-array VLSI chip. This gate array is fabricated using a 2-µm n-well CMOS technology, with double-level metallization. As an example, a 32-bit parallel array multiplier is designed using a fully automatic CAD System. The density of CMOS gate arrays using gate isolation is estimated to be 1.10 to 1.26 times greater than that of the arrays using several types of oxide isolation, when implementing circuits with complexities on the order of 10K gates.
Keywords
Aluminum; CMOS logic circuits; CMOS technology; Design automation; Isolation technology; Large scale integration; Logic arrays; Metallization; Very large scale integration; Wiring;
fLanguage
English
Journal_Title
Electron Devices, IEEE Transactions on
Publisher
ieee
ISSN
0018-9383
Type
jour
DOI
10.1109/T-ED.1985.21968
Filename
1484715
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