• DocumentCode
    1099097
  • Title

    A 10K-gate CMOS gate array based on a gate isolation structure

  • Author

    Sakashita, Kazuhiro ; Ueda, Masahiro ; Arakawa, Takahiko ; Asai, Sotoju ; Fujimura, Tatsuo ; Ohkura, Isao

  • Author_Institution
    Mitsubishi Electric Corporation, Itami, Japan
  • Volume
    32
  • Issue
    2
  • fYear
    1985
  • fDate
    2/1/1985 12:00:00 AM
  • Firstpage
    493
  • Lastpage
    497
  • Abstract
    This paper describes an effect of the "gate isolation" technique and its application to a 10K-gate CMOS gate-array VLSI chip. This gate array is fabricated using a 2-µm n-well CMOS technology, with double-level metallization. As an example, a 32-bit parallel array multiplier is designed using a fully automatic CAD System. The density of CMOS gate arrays using gate isolation is estimated to be 1.10 to 1.26 times greater than that of the arrays using several types of oxide isolation, when implementing circuits with complexities on the order of 10K gates.
  • Keywords
    Aluminum; CMOS logic circuits; CMOS technology; Design automation; Isolation technology; Large scale integration; Logic arrays; Metallization; Very large scale integration; Wiring;
  • fLanguage
    English
  • Journal_Title
    Electron Devices, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9383
  • Type

    jour

  • DOI
    10.1109/T-ED.1985.21968
  • Filename
    1484715