DocumentCode
1099304
Title
Characteristic voltage of programmed metal-to-metal antifuses
Author
Zhang, G. ; Hu, C. ; Yu, P. ; Chiang, S. ; Hamdy, E.
Author_Institution
Dept. of Phys., California Univ., Berkeley, CA, USA
Volume
15
Issue
5
fYear
1994
fDate
5/1/1994 12:00:00 AM
Firstpage
166
Lastpage
168
Abstract
The characteristic voltage V/sub f/ of different programmed metal-to-metal antifuses was measured and found to be nearly independent of the electrode materials. An electrothermal model, used previously to predict programmed silicon-electrode antifuse resistance, was extended to explain the above phenomenon. The metal-to-metal antifuse resistance vs. the programming current is governed by the Wiedeman-Franz Law.<>
Keywords
PLD programming; electric fuses; logic arrays; modelling; FPGA; Wiedeman-Franz Law; characteristic voltage; electrothermal model; field programmable gate arrays; programmed metal-to-metal antifuses; programming current; Conducting materials; Conductivity; Electric resistance; Electrical resistance measurement; Electrodes; Electrothermal effects; Gold; Inorganic materials; Predictive models; Voltage;
fLanguage
English
Journal_Title
Electron Device Letters, IEEE
Publisher
ieee
ISSN
0741-3106
Type
jour
DOI
10.1109/55.291598
Filename
291598
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