Title :
Characteristic voltage of programmed metal-to-metal antifuses
Author :
Zhang, G. ; Hu, C. ; Yu, P. ; Chiang, S. ; Hamdy, E.
Author_Institution :
Dept. of Phys., California Univ., Berkeley, CA, USA
fDate :
5/1/1994 12:00:00 AM
Abstract :
The characteristic voltage V/sub f/ of different programmed metal-to-metal antifuses was measured and found to be nearly independent of the electrode materials. An electrothermal model, used previously to predict programmed silicon-electrode antifuse resistance, was extended to explain the above phenomenon. The metal-to-metal antifuse resistance vs. the programming current is governed by the Wiedeman-Franz Law.<>
Keywords :
PLD programming; electric fuses; logic arrays; modelling; FPGA; Wiedeman-Franz Law; characteristic voltage; electrothermal model; field programmable gate arrays; programmed metal-to-metal antifuses; programming current; Conducting materials; Conductivity; Electric resistance; Electrical resistance measurement; Electrodes; Electrothermal effects; Gold; Inorganic materials; Predictive models; Voltage;
Journal_Title :
Electron Device Letters, IEEE
