DocumentCode :
1099390
Title :
A theory of the Hooge parameters of solid-state devices
Author :
Van Der Ziel, Aldert ; Handel, P.H. ; Zhu, Xichen ; Duh, Kuang Hann
Author_Institution :
University of Minnesota, Minneapolis, MN
Volume :
32
Issue :
3
fYear :
1985
fDate :
3/1/1985 12:00:00 AM
Firstpage :
667
Lastpage :
671
Abstract :
Handel\´s theory of quantum 1/f noise is applied to the Hooge parameters of bipolar transistors and various types of FET\´s. Very low values for the Hooge parameters αHnand αHpfor electrons and holes are obtained. For several cases the experimental data seem to agree with the predicted theoretical limit whereas in other cases the mobility 1/f noise is masked by other noise sources. In good GaAs devices the predicted quantum limit for αHnis reached within a factor 5-10. The theory is also applied to the Hg1-xCdxTe materials and devices. Because of the very low effective masses involved, the theory predicts values as high as 2 × 10-4-2 × 10-5, depending on x . What remains presently unexplained are the high values of αHfor semiconductor resistors and long p-n diodes.
Keywords :
Bipolar transistors; Charge carrier processes; Effective mass; FETs; Gallium arsenide; Mercury (metals); Quantum mechanics; Semiconductor device noise; Solid state circuits; Tellurium;
fLanguage :
English
Journal_Title :
Electron Devices, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9383
Type :
jour
DOI :
10.1109/T-ED.1985.21996
Filename :
1484742
Link To Document :
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