DocumentCode :
1099531
Title :
Comments on "Analysis of photocurrent decay (PCD) method for measuring minority-carrier lifetime in solar cells"
Author :
Harrett, T.
Author_Institution :
STC Components Limited, Paignton, England
Volume :
32
Issue :
3
fYear :
1985
fDate :
3/1/1985 12:00:00 AM
Firstpage :
725
Lastpage :
726
Abstract :
The three-dimensional photocurrent decay analysis in the above paper has been extended in the case of the thick cell. The resulting expression has been solved numerically to obtain a set of curves relating the minority-carrier lifetime τ with the decay time 
(both normalized with respect to 
, where 
and 
are the optical absorption and minority-carrier diffusion coefficients, respectively) for a wide range of current decay ratios.
(both normalized with respect to , where and are the optical absorption and minority-carrier diffusion coefficients, respectively) for a wide range of current decay ratios.fLanguage :
English
Journal_Title :
Electron Devices, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9383
Type :
jour
DOI :
10.1109/T-ED.1985.22009
Filename :
1484755
Link To Document :
