• DocumentCode
    109961
  • Title

    Low-Loss Singlemode PECVD Silicon Nitride Photonic Wire Waveguides for 532–900 nm Wavelength Window Fabricated Within a CMOS Pilot Line

  • Author

    Subramanian, Ananth Z. ; Neutens, Pieter ; Dhakal, Ashim ; Jansen, Roelof ; Claes, Tom ; Rottenberg, Xavier ; Peyskens, Frederic ; Selvaraja, Shankar ; Helin, Philippe ; Dubois, Beatrice ; Leyssens, Kenny ; Severi, Simone ; Deshpande, Paru ; Baets, Roel ;

  • Author_Institution
    Photonics Res. Group, Ghent Univ., Ghent, Belgium
  • Volume
    5
  • Issue
    6
  • fYear
    2013
  • fDate
    Dec. 2013
  • Firstpage
    2202809
  • Lastpage
    2202809
  • Abstract
    PECVD silicon nitride photonic wire waveguides have been fabricated in a CMOS pilot line. Both clad and unclad single mode wire waveguides were measured at λ = 532, 780, and 900 nm, respectively. The dependence of loss on wire width, wavelength, and cladding is discussed in detail. Cladded multimode and singlemode waveguides show a loss well below 1 dB/cm in the 532-900 nm wavelength range. For singlemode unclad waveguides, losses 1 dB/cm were achieved at λ = 900 nm, whereas losses were measured in the range of 1-3 dB/cm for λ = 780 and 532 nm, respectively.
  • Keywords
    CMOS integrated circuits; cladding techniques; integrated optics; optical waveguides; plasma CVD; silicon compounds; CMOS pilot line; PECVD; SiN; cladded multimode waveguides; photonic wire waveguides; single mode unclad waveguides; single mode wire waveguides; wavelength 532 nm to 900 nm; Waveguides; fabrication and characterization; gratings; photonic materials; waveguide devices;
  • fLanguage
    English
  • Journal_Title
    Photonics Journal, IEEE
  • Publisher
    ieee
  • ISSN
    1943-0655
  • Type

    jour

  • DOI
    10.1109/JPHOT.2013.2292698
  • Filename
    6674990