Title :
Edge-geometry YBa2Cu3O7-x/Au/Nb SNS devices
Author :
Hunt, B.D. ; Foote, M.C. ; Bajuk, L.
Author_Institution :
Jet Propulsion Lab., California Inst. of Technol., Pasadena, CA, USA
fDate :
3/1/1991 12:00:00 AM
Abstract :
The fabrication and electrical properties of edge-geometry YBaCuO/Au/Nb weak links are described. Superconductor/normal-metal/superconductor (SNS) devices of this type serve as sensitive probes of the electrical quality of the YBaCuO/Au interface. For device applications, the edge geometry has the advantage of placing the critical N/S device interface on the longer coherence length a-b surface, and it simplifies the fabrication of weak links with submicron dimensions. These structures are fabricated using laser-ablated, in situ, c-axis-oriented YBaCuO thin films, with both oxygen-annealed and unannealed YBaCuO/Au interfaces. The YBaCuO film edges are patterned using ion milling, followed by a low-energy-ion cleaning step and in situ deposition of Au and Nb. Devices with areas in the 10-7-10-8-cm2 range have been fabricated with RnA products lower than 10 -8 Ω-cm2 and critical current densities up to 3 kA/cm2. Josephson coupling is verified by the observation of microwave steps under 10-GHz microwave irradiation. The best results have been obtained with annealed YBaCuO/Au interfaces
Keywords :
Josephson effect; barium compounds; critical current density (superconductivity); gold; high-temperature superconductors; niobium; superconducting thin films; superconductive tunnelling; yttrium compounds; 10 GHz; Josephson coupling; SNS devices; YBa2Cu3O7-x-Au-Nb; coherence length; critical current densities; edge-geometry; electrical properties; fabrication; high temperature superconductor; ion milling; laser-ablated; low-energy-ion cleaning step; microwave steps; submicron dimensions; thin films; weak links; Geometrical optics; Gold; Milling; Niobium; Optical device fabrication; Probes; Superconducting devices; Superconducting microwave devices; Transistors; Yttrium barium copper oxide;
Journal_Title :
Magnetics, IEEE Transactions on