Title :
A 0.15 V Input Energy Harvesting Charge Pump With Dynamic Body Biasing and Adaptive Dead-Time for Efficiency Improvement
Author :
Jungmoon Kim ; Mok, Philip K. T. ; Chulwoo Kim
Author_Institution :
Dept. of Electr. Eng., Korea Univ., Seoul, South Korea
Abstract :
A charge pump using 0.13- μm CMOS process for low-voltage energy harvesting is presented. A low-power adaptive dead-time (AD) circuit is used which automatically optimizes the dead-time according to the input voltage. A negative charge pump is also utilized for high efficiency at low input voltages (VIN). The AD circuit improves efficiency by 17% at VIN of 0.2 V compared to the fixed dead time circuit as well as enables the charge pump to work at VIN down to 0.15 V. Dynamic body bias (DBB) and switch-conductance enhancement techniques are applied to a unit stage of the three-stage charge pump. The reverse current flowing through the cross-coupled NMOS switches is prevented and the current transfer is also maximized. Together with the AD circuit and the DBB technique, the maximum output current was improved by 240% as compared to the conventional charge pump design using only the forward body bias.
Keywords :
MOS integrated circuits; charge pump circuits; energy harvesting; low-power electronics; cross-coupled NMOS switches; dynamic body biasing; efficiency improvement; energy harvesting charge pump; low-power adaptive dead-time circuit; low-voltage energy harvesting; reverse current; size 0.13 mum; switch-conductance enhancement techniques; three-stage charge pump; voltage 0.15 V; voltage 0.2 V; Charge pumps; Control systems; Energy harvesting; Leakage currents; MOSFET; Threshold voltage; Body biasing; boost converter; charge pump; conversion efficiency; dc-dc converter; dead-time; energy harvesting; low voltage; threshold voltage; variation;
Journal_Title :
Solid-State Circuits, IEEE Journal of
DOI :
10.1109/JSSC.2014.2375824