DocumentCode
1100109
Title
A SPICE modeling technique for GaAs MESFET IC´s
Author
Huang, Chern I. ; Thorbjornsen, Arthur R.
Author_Institution
Air Force Wright Aeronautical Laboratories, Wright-Patterson Air Force Base, OH
Volume
32
Issue
5
fYear
1985
fDate
5/1/1985 12:00:00 AM
Firstpage
996
Lastpage
998
Abstract
A vertically integrated device modeling technique for GaAs IC´s is presented for use in circuit simulation. Most of the SPICE2 capability can be utilized for modeling the gate transit time and parasitic effects. A computer program has also been developed to extract model parameters from the measured device data.
Keywords
Current measurement; Delay effects; Electrical resistance measurement; Equations; Gallium arsenide; Integrated circuit modeling; MESFET integrated circuits; Mathematical model; SPICE; Voltage;
fLanguage
English
Journal_Title
Electron Devices, IEEE Transactions on
Publisher
ieee
ISSN
0018-9383
Type
jour
DOI
10.1109/T-ED.1985.22060
Filename
1484806
Link To Document