Title :
A Time-Domain Band-Gap Temperature Sensor in SOI CMOS for High-Temperature Applications
Author :
Pathrose, Jerrin ; Chengye Liu ; Chai, Kevin T. C. ; Yong Ping Xu
Author_Institution :
Dept. of Electr. & Comput. Eng., Nat. Univ. of Singapore, Singapore, Singapore
Abstract :
This brief presents a temperature sensor operating over a wide temperature range from 25°C to 225°C for oil well instrumentation applications. The temperature sensor is implemented with a simple time-domain architecture and a mapping function at the digital back end. The mapping function eliminates the need for a band-gap reference, whose temperature coefficient deteriorates the accuracy, particularly for high and wide temperature range of operation. The time-domain implementation results in low power consumption and chip area. With digital calibration at room temperature using a field-programmable gate array, the sensor achieves a worst case inaccuracy of +1.6 °C/ -1.5 °C and consumes only 20-μA current under a 4.5-V supply. The chip is fabricated with a commercial partially depleted silicon-on-insulator CMOS process and occupies a chip area of 0.41 mm2.
Keywords :
CMOS integrated circuits; calibration; elemental semiconductors; field programmable gate arrays; silicon; silicon-on-insulator; temperature measurement; temperature sensors; time-domain analysis; SOI CMOS; Si; band-gap reference; commercial partially depleted silicon-on-insulator; current 20 muA; digital back end; digital calibration; field-programmable gate array; high-temperature application; mapping function elimination; oil well instrumentation application; temperature -1.5 degC; temperature 1.6 degC; temperature 25 degC to 225 degC; temperature 293 K to 298 K; time-domain band-gap temperature sensor; voltage 4.5 V; CMOS integrated circuits; Calibration; Photonic band gap; Temperature distribution; Temperature measurement; Temperature sensors; Band-gap reference (BGR); Bandgap reference; High temperature electronics; Ratiometric measurement; Smart temperature sensor; high-temperature electronics; ratiometric measurement; smart temperature sensor;
Journal_Title :
Circuits and Systems II: Express Briefs, IEEE Transactions on
DOI :
10.1109/TCSII.2014.2386231