• DocumentCode
    1100204
  • Title

    An analysis of the thermal response of power chip packages

  • Author

    Kadambi, Vendanth ; Abuaf, Nesim

  • Author_Institution
    General Electric Corporate Research and Development, Schenectady, NY
  • Volume
    32
  • Issue
    6
  • fYear
    1985
  • fDate
    6/1/1985 12:00:00 AM
  • Firstpage
    1024
  • Lastpage
    1033
  • Abstract
    Since power densities in integrated circuits and power semiconductor devices are continuously increasing due to miniaturization of circuitry, the design of optimum heat spreaders and heat sinks for these applications requires rather sophisticated calculational methods. The chips and spreaders are usually rectangular in shape and although the problem is three-dimensional in nature, it is usually approximated by two-dimensional configurations. Steady-state and transient analytic solutions are presented for the axisymmetric, two-dimensional, and three-dimensional spreader geometries, which can be used to calculate the thermal resistance of the base alone. To determine the thermal resistance of the chip-base combination, the one-dimensional chip thermal resistance should be added to that of the base. These analytic solutions provide calculational means which are easier than the numerical methods. The exact analytic steady-state and transient solutions developed for the axisymmetric, two-dimensional, and three-dimensional configurations are in excellent agreement with the numerical calculations. The parametric calculations provide information on the important guidelines that a packaging engineer should bear in mind while designing and optimizing heat spreaders for power semiconductor applications. These points can be summarized as follows: 1) for a given chip area there exists an optimal base area, 2) increasing the base thickness initially decreases the thermal resistance and beyond a certain limit the latter increases with base thickness, and 3) the convective heat transfer coefficient strongly affects the thermal resistance and the usual assumption of an isothermal base is not always appropriate.
  • Keywords
    Application specific integrated circuits; Geometry; Heat sinks; Integrated circuit packaging; Power semiconductor devices; Semiconductor device packaging; Shape; Steady-state; Thermal resistance; Transient analysis;
  • fLanguage
    English
  • Journal_Title
    Electron Devices, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9383
  • Type

    jour

  • DOI
    10.1109/T-ED.1985.22068
  • Filename
    1484814