Title :
120-Gb/s VCSEL-based parallel-optical interconnect and custom 120-Gb/s testing station
Author :
Kuchta, Daniel M. ; Kwark, Young H. ; Schuster, Christian ; Baks, Christian ; Haymes, Chuck ; Schaub, Jeremy ; Pepeljugoski, Petar ; Shan, Lei ; John, Richard ; Kucharski, Daniel ; Rogers, Dennis ; Ritter, Mark ; Jewell, Jack ; Graham, Luke A. ; Schröding
Author_Institution :
IBM T. J. Watson Res. Center, Yorktown Heights, NY, USA
Abstract :
A 120-Gb/s optical link (12 channels at 10 Gb/s/ch for both a transmitter and a receiver) has been demonstrated. The link operated at a bit-error rate of less than 10-12 with all channels operating and with a total fiber length of 316 m, which comprises 300 m of next-generation (OM-3) multimode fiber (MMF) plus 16 m of standard-grade MMF. This is the first time that a parallel link with this bandwidth at this per-channel rate has ever been demonstrated. For the transmitter, an SiGe laser driver was combined with a GaAs vertical-cavity surface-emitting laser (VCSEL) array. For the receiver, the signal from a GaAs photodiode array was amplified by a 12-channel SiGe receiver integrated circuit. Key to the demonstration were several custom testing tools, most notably a 12-channel pattern generator. The package is very similar to the commercial parallel modules that are available today, but the per-channel bit rate is three times higher than that for the commercial modules. The new modules demonstrate the possibility of extending the parallel-optical module technology that is available today into a distance-bandwidth product regime that is unattainable for copper cables.
Keywords :
Ge-Si alloys; driver circuits; error statistics; gallium arsenide; optical crosstalk; optical fibre communication; optical interconnections; optical receivers; optical testing; optical transmitters; packaging; semiconductor laser arrays; surface emitting lasers; telecommunication channels; 10 Gbit/s; 12-channel SiGe receiver integrated circuit; 12-channel pattern generator; 120 Gbit/s; 316 m; GaAs; GaAs vertical-cavity surface-emitting laser array; SiGe; SiGe laser driver; VCSEL; bit-error rate; channels; custom testing station; multimode fiber; optical link; packaging; parallel-optical interconnect; per-channel bit rate; receiver; transmitter; Fiber lasers; Gallium arsenide; Germanium silicon alloys; Integrated circuit interconnections; Optical fiber communication; Optical transmitters; Silicon germanium; Surface emitting lasers; Testing; Vertical cavity surface emitting lasers; Crosstalk; driver circuits; optical interconnections; optoelectronic packaging; parallel-optical link; receivers; semiconductor lasers; testing;
Journal_Title :
Lightwave Technology, Journal of
DOI :
10.1109/JLT.2004.833255