• DocumentCode
    1100315
  • Title

    An 8-Bit Flash Analog-to-Digital Converter in Standard CMOS Technology Functional From 4.2 K to 300 K

  • Author

    Creten, Ybe ; Merken, Patrick ; Sansen, Willy ; Mertens, Robert P. ; Van Hoof, Chris

  • Author_Institution
    IMEC, Leuven
  • Volume
    44
  • Issue
    7
  • fYear
    2009
  • fDate
    7/1/2009 12:00:00 AM
  • Firstpage
    2019
  • Lastpage
    2025
  • Abstract
    This paper presents the first flash Analog-to-Digital Converter (ADC) in standard CMOS technology that functions from 300 K (room temperature) down to 4.2 K. It has been designed to operate in cryogenic sensor systems as they are cooled from room temperature to their final cryogenic operating temperature. In order to preserve the circuit´s performance over this wide temperature range, even in the presence of temperature-induced transistor anomalies, dedicated architecture and switching schemes are employed. SPICE models for adequate circuit simulation at 4.2 K have been extracted. A first prototype of the chosen architecture, an 8-bit ADC in a standard 0.7 mum CMOS technology, achieves a differential nonlinearity (DNL) of 0.5 LSB at room temperature and 1 LSB at 4.2 K at a sampling frequency of 12.5 kHz.
  • Keywords
    CMOS digital integrated circuits; SPICE; analogue-digital conversion; cryogenic electronics; temperature sensors; SPICE model; cryogenic operating temperature; cryogenic sensor system; differential nonlinearity; flash analog-to-digital converter; frequency 12.5 kHz; size 0.7 mum; standard CMOS technology; temperature 4.2 K to 300 K; word length 8 bit; Analog-digital conversion; CMOS technology; Circuit optimization; Cryogenics; SPICE; Semiconductor device modeling; Sensor systems; Switching circuits; Temperature distribution; Temperature sensors; Cryogenic ADC; LHT; cryogenic CMOS; cryogenic electronics; low-temperature electronics;
  • fLanguage
    English
  • Journal_Title
    Solid-State Circuits, IEEE Journal of
  • Publisher
    ieee
  • ISSN
    0018-9200
  • Type

    jour

  • DOI
    10.1109/JSSC.2009.2021918
  • Filename
    5109798