Title : 
An Exact Closed-Form Solution for Lightning-Induced Overvoltages Calculations
         
        
            Author : 
Andreotti, A. ; Assante, D. ; Mottola, F. ; Verolino, L.
         
        
            Author_Institution : 
Electr. Eng. Dept., Univ. Federico II of Napoli, Naples
         
        
        
        
        
            fDate : 
7/1/2009 12:00:00 AM
         
        
        
        
            Abstract : 
We present the evaluation of the induced voltages in a lossless single transmission line, located at a given height over an infinite conductivity ground plane, and exited by an external field due to a step current moving along a vertical channel. This is a classic topic of the theory of lightning-induced voltages on power lines. The technical literature related to this topic has performed a significant effort; however, only approximated formulas have been obtained so far. In this paper, we derive the exact closed-form solution. We also will discuss, evaluate, and compare the approximated formulas with reference to the proposed exact one, thus contributing to clarifying a matter that still is debated and sometimes misleading, as we will show in the paper. We furthermore recall that the examined lightning-induced voltages model is fundamental for the IEEE standard 1410, a guide for improving the lightning performance of power distribution line.
         
        
            Keywords : 
lightning protection; overvoltage protection; power overhead lines; power transmission lines; power transmission protection; IEEE standard 1410; closed-form solution; infinite conductivity ground plane; lightning-induced overvoltage calculation; lossless single transmission line; overhead lines; power distribution line; Closed-form solution; Conductivity; Impedance; Lightning; Magnetic fields; Power distribution lines; Power transmission lines; Propagation losses; Surges; Voltage; Induced overvoltages; lightning; overhead lines;
         
        
        
            Journal_Title : 
Power Delivery, IEEE Transactions on
         
        
        
        
        
            DOI : 
10.1109/TPWRD.2008.2005395