DocumentCode :
1100757
Title :
The Hooge parameters for n- and p-type Hg1-xCdxTe
Author :
Zhu, Xi-chen ; Wu, Xiaolan ; Van Der, Ziel A. ; Kelso, E.G.
Author_Institution :
Kunming Institute of Physics, Kunming, Peoples Republic of China
Volume :
32
Issue :
7
fYear :
1985
fDate :
7/1/1985 12:00:00 AM
Firstpage :
1353
Lastpage :
1354
Abstract :
The values of the electron effective mass m_{e*} in Hg1-xCdxTe have been calculated for x = 0.20, 0.30, 0.40. Using the Debye temperature θDfor CdTe, the values of the Hooge parameter for Hg1-xCdxTe have been estimated as a function of x and the temperature T . In view of the uncertainty in θD, the estimate is probably correct within a factor of 2-3. We have also directly calculated θDfor Hg1-xCdxTe and its associated Hooge parameters as a function of x ; except for a possible temperature dependence of θD, the results should be correct near room temperature.
Keywords :
Density estimation robust algorithm; Effective mass; Electrons; Frequency; Mercury (metals); Resistors; Semiconductor device noise; Temperature dependence; Temperature distribution; Uncertainty;
fLanguage :
English
Journal_Title :
Electron Devices, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9383
Type :
jour
DOI :
10.1109/T-ED.1985.22123
Filename :
1484869
Link To Document :
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