Title :
Large Format AlInAs–InGaAs Quantum-Well Infrared Photodetector Focal Plane Array For Midwavelength Infrared Thermal Imaging
Author :
Ozer, S. ; Tumkaya, U. ; Besikci, C.
Author_Institution :
Middle East Tech. Univ., Ankara
Abstract :
We report the first large format (640times512) AlInAs-InGaAs quantum-well infrared photodetector (QWIP) focal plane array (FPA), and investigate the characteristics of AlInAs-InGaAs QWIPs both at pixel and FPA level. The measurements on the detectors fabricated with molecular beam epitaxy grown epilayer structure including 30 InGaAs quantum wells (26 Aring thick, ND=2times1018 cm-3) yielded very promising characteristics. The detectors with lambdap=4.2 mum and Deltalambda/lambdap=25% displayed a background-limited performance temperature as high as 105 K with f/2 aperture. The noise equivalent temperature difference of the FPA is as low as 23 mK (f/1.5) at 105-K sensor temperature with 99.6% operability. These results are comparable to the best results reported for AlGaAs-InGaAs midwavelength infrared QWIPs showing the promise of this material system for completely lattice-matched multiband QWIP FPAs.
Keywords :
III-V semiconductors; aluminium compounds; focal planes; gallium arsenide; indium compounds; infrared detectors; photodetectors; quantum well devices; semiconductor quantum wells; background-limited performance temperature; epilayer structure; f/2 aperture; large format quantum-well infrared photodetector focal plane array; lattice-matched multiband QWIP FPA; midwavelength infrared thermal imaging; molecular beam epitaxy; noise equivalent temperature difference; sensor temperature; size 26 angstrom; temperature 105 K; wavelength 4.2 mum; Apertures; Detectors; Indium gallium arsenide; Infrared imaging; Molecular beam epitaxial growth; Optical imaging; Photodetectors; Quantum wells; Temperature sensors; Thickness measurement; Focal plane array (FPA); infrared detector;
Journal_Title :
Photonics Technology Letters, IEEE
DOI :
10.1109/LPT.2007.903338