DocumentCode
1100967
Title
Characterization of ultra-high-speed pseudomorphic AlGaAs/InGaAs (on GaAs) MODFETs
Author
Nguyen, Loi D. ; Tasker, Paul J. ; Radulescu, David C. ; Eastman, Lester F.
Author_Institution
Sch. of Electr. Eng., Cornell Univ., Ithaca, NY, USA
Volume
36
Issue
10
fYear
1989
fDate
10/1/1989 12:00:00 AM
Firstpage
2243
Lastpage
2248
Abstract
The authors report a detailed characterization of ultrahigh-speed pseudomorphic AlGaAs/InGaAs (on GaAs) modulation-doped field-effect transistors (MODFETs) with emphasis on the device switching characteristics. The nominal 0.1-μm gate-length device exhibit a current gain cutoff frequency (f t) as high as 152 GHz. This value of f t corresponds to a total delay of approximately 1.0 ps and is attributed to the optimization of layer structure, device layout, and fabrication process. It is shown that the electron transit time in these very short gate-length devices still accounts for approximately 60% of the total delay, and, as a result, significant improvements in switching speed are possible with further reductions of gate length. The results reported clearly demonstrate the potential of the pseudomorphic AlGaAs/InGaAs MODFET as an ultrahigh-speed device. Its excellent switching characteristics are attributed to the high saturation velocity (~2×107 cm/s), 2DEG sheet density (2.5×1012 cm-2), and current drive capability (>200 mA/mm at the peak transconductance)
Keywords
III-V semiconductors; aluminium compounds; gallium arsenide; high electron mobility transistors; indium compounds; semiconductor switches; 0.1 micron; 1 ps; 152 GHz; 2DEG sheet density; AlGaAs-InGaAs-GaAs; GaAs; current drive capability; current gain cutoff frequency; delay; electron transit time; gate-length; saturation velocity; switching characteristics; switching speed; ultrahigh speed pseudomorphic MODFET; Cutoff frequency; Delay; Electrons; Epitaxial layers; FETs; Fabrication; Gallium arsenide; HEMTs; Indium gallium arsenide; MODFETs;
fLanguage
English
Journal_Title
Electron Devices, IEEE Transactions on
Publisher
ieee
ISSN
0018-9383
Type
jour
DOI
10.1109/16.40906
Filename
40906
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