• DocumentCode
    1100967
  • Title

    Characterization of ultra-high-speed pseudomorphic AlGaAs/InGaAs (on GaAs) MODFETs

  • Author

    Nguyen, Loi D. ; Tasker, Paul J. ; Radulescu, David C. ; Eastman, Lester F.

  • Author_Institution
    Sch. of Electr. Eng., Cornell Univ., Ithaca, NY, USA
  • Volume
    36
  • Issue
    10
  • fYear
    1989
  • fDate
    10/1/1989 12:00:00 AM
  • Firstpage
    2243
  • Lastpage
    2248
  • Abstract
    The authors report a detailed characterization of ultrahigh-speed pseudomorphic AlGaAs/InGaAs (on GaAs) modulation-doped field-effect transistors (MODFETs) with emphasis on the device switching characteristics. The nominal 0.1-μm gate-length device exhibit a current gain cutoff frequency (ft) as high as 152 GHz. This value of ft corresponds to a total delay of approximately 1.0 ps and is attributed to the optimization of layer structure, device layout, and fabrication process. It is shown that the electron transit time in these very short gate-length devices still accounts for approximately 60% of the total delay, and, as a result, significant improvements in switching speed are possible with further reductions of gate length. The results reported clearly demonstrate the potential of the pseudomorphic AlGaAs/InGaAs MODFET as an ultrahigh-speed device. Its excellent switching characteristics are attributed to the high saturation velocity (~2×107 cm/s), 2DEG sheet density (2.5×1012 cm-2), and current drive capability (>200 mA/mm at the peak transconductance)
  • Keywords
    III-V semiconductors; aluminium compounds; gallium arsenide; high electron mobility transistors; indium compounds; semiconductor switches; 0.1 micron; 1 ps; 152 GHz; 2DEG sheet density; AlGaAs-InGaAs-GaAs; GaAs; current drive capability; current gain cutoff frequency; delay; electron transit time; gate-length; saturation velocity; switching characteristics; switching speed; ultrahigh speed pseudomorphic MODFET; Cutoff frequency; Delay; Electrons; Epitaxial layers; FETs; Fabrication; Gallium arsenide; HEMTs; Indium gallium arsenide; MODFETs;
  • fLanguage
    English
  • Journal_Title
    Electron Devices, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9383
  • Type

    jour

  • DOI
    10.1109/16.40906
  • Filename
    40906