DocumentCode :
1101129
Title :
Extending the feature vector for automatic face recognition
Author :
Jia, Xiaoguang ; Nixon, Mark S.
Author_Institution :
Sch. of Astronaut., Harbin Inst. of Technol., China
Volume :
17
Issue :
12
fYear :
1995
fDate :
12/1/1995 12:00:00 AM
Firstpage :
1167
Lastpage :
1176
Abstract :
Many features can be used to describe a human face but few have been used in combination. Extending the feature vector using orthogonal sets of measurements can reduce the variance of a matching measure, to improve discrimination capability. This paper investigates how different features can be used for discrimination, alone or when integrated into an extended feature vector. This study concentrates on improving feature definition and extraction from a frontal view image, incorporating and extending established measurements. These form an extended feature vector based on four feature sets: geometric (distance) measurements, the eye region, the outline contour, and the profile. The profile, contour, and eye region are described by the Walsh power spectrum, normalized Fourier descriptors, and normalized moments, respectively. Although there is some correlation between the geometrical measures and the other sets, their bases (distance, shape description, sequency, and statistics) are orthogonal and hence appropriate for this research. A database of face images was analyzed using two matching measures which were developed to control differently the contributions of elements of the feature sets. The match was evaluated for both measures for the separate feature sets and for the extended feature vector. Results demonstrated that no feature set alone was sufficient for recognition whereas the extended feature vector could discriminate between subjects successfully
Keywords :
face recognition; feature extraction; image matching; Walsh power spectrum; automatic face recognition; discrimination capability; eye region; feature vector; geometric measurements; human face; matching measure; normalized Fourier descriptors; normalized moments; orthogonal sets; outline contour; profile; Extraterrestrial measurements; Face recognition; Facial features; Feature extraction; Humans; Image analysis; Image databases; Shape; Spatial databases; Statistics;
fLanguage :
English
Journal_Title :
Pattern Analysis and Machine Intelligence, IEEE Transactions on
Publisher :
ieee
ISSN :
0162-8828
Type :
jour
DOI :
10.1109/34.476509
Filename :
476509
Link To Document :
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