DocumentCode
1101576
Title
A fast 8K × 8 mixed CMOS static RAM
Author
Shinohara, Hirofumi ; Anami, Kenji ; Yoshihara, Tsutomu ; Kihara, Yuji ; Kohno, Yoshio ; Akasaka, Yoichi ; Kayano, Shinpei
Author_Institution
Mitsubishi Electric Corporation, Itami, Japan
Volume
32
Issue
9
fYear
1985
fDate
9/1/1985 12:00:00 AM
Firstpage
1792
Lastpage
1796
Abstract
This paper describes a fast 8K × 8 static RAM fabricated with a mixed CMOS technology. To realize a fast access time and yet a low active power, a block-oriented die architecture with four submodules and a new sense amplifier are applied. An address access time of 34 ns and a chip select access time of 38 ns have been achieved at an active power of 90 mW. In addition to redundant memory cells, the RAM incorporates a spare element disable (SED) function to make it easy to obtain the information of the replaced memory cell. Another feature is a high latchup immunity of the CMOS peripheral circuits. This is obtained from an optimized well structure and guard bands around the wells. A 2-µm design rule combined with the double-level polysilicon layer allowed for layout of the NMOS memory cell in 266.5 µm2and design of the die in 34.3 mm2.
Keywords
Circuits; Decoding; Differential amplifiers; MOS devices; Mirrors; Power amplifiers; Power dissipation; Random access memory; Read-write memory; Switches;
fLanguage
English
Journal_Title
Electron Devices, IEEE Transactions on
Publisher
ieee
ISSN
0018-9383
Type
jour
DOI
10.1109/T-ED.1985.22199
Filename
1484945
Link To Document