• DocumentCode
    1101599
  • Title

    1/f noise in n+-p diodes

  • Author

    Van Der Ziel, Aldert ; Handel, Peter H.

  • Author_Institution
    University of Minnesota, Minneapolis, MN
  • Volume
    32
  • Issue
    9
  • fYear
    1985
  • fDate
    9/1/1985 12:00:00 AM
  • Firstpage
    1802
  • Lastpage
    1805
  • Abstract
    A simple quantum expression of the 1/f noise spectrum S_{I}(f) of n+-p diodes operating in the generation-recombination (g-r) mode is obtained that is valid for all bias voltages. It turns out to be quite small. A new quantum 1/f noise effect in diodes operating in the diffusion mode is evaluated; it mimics g-r 1/f noise, but is much larger than it. It should predominate if Umklapp noise is not observable (this has been found to be the case for diffusion in the base region of p+-n-p or n+-p-n BJT\´s).
  • Keywords
    Acceleration; Charge carrier processes; Density estimation robust algorithm; Diodes; Electron emission; Electron traps; Fusion power generation; Noise generators; Radiative recombination; Spontaneous emission;
  • fLanguage
    English
  • Journal_Title
    Electron Devices, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9383
  • Type

    jour

  • DOI
    10.1109/T-ED.1985.22201
  • Filename
    1484947