DocumentCode :
1101645
Title :
Investigation of Short-Term Changes in Visual Evoked Potentials With Windowed Adaptive Chirplet Transform
Author :
Cui, Jie ; Wong, Willy
Author_Institution :
Univ. of Toronto, Toronto
Volume :
55
Issue :
4
fYear :
2008
fDate :
4/1/2008 12:00:00 AM
Firstpage :
1449
Lastpage :
1454
Abstract :
We propose a new application of the adaptive chirplet transform that involves partitioning signals into non-overlapping sequential segments. From these segments, the local time-frequency structures of the signal are estimated by using a four-parameter chirplet decomposition. Entitled the windowed adaptive chirplet transform (windowed ACT), this approach is applied to the analysis of visual evoked potentials (VEPs). It can provide a unified and compact representation of VEPs from the transient buildup to the steady-state portion with less computational cost than its non-windowed counterpart. This paper also details a method to select the optimal window length for signal segmentation. This approach will be useful for long-term signal monitoring as well as for signal feature extraction and data compression.
Keywords :
bioelectric potentials; medical signal processing; neurophysiology; data compression; four-parameter chirplet decomposition; local time-frequency structures; long-term signal monitoring; nonoverlapping sequential segments; optimal window length; signal feature extraction; signal segmentation; surface electrical potentials; visual evoked potentials; windowed adaptive chirplet transform; Adhesives; Biochemistry; Chemistry; Chirp; Humans; Nanobioscience; Nerve fibers; Neurons; Silicon; Surface topography; Chirplet transform; optimal window length; short-term changes; time-frequency analysis; visual evoked potentials; Adaptation, Physiological; Algorithms; Diagnosis, Computer-Assisted; Electroencephalography; Evoked Potentials, Visual; Humans; Neuronal Plasticity; Sensitivity and Specificity; Signal Processing, Computer-Assisted; Visual Cortex;
fLanguage :
English
Journal_Title :
Biomedical Engineering, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9294
Type :
jour
DOI :
10.1109/TBME.2008.918439
Filename :
4472066
Link To Document :
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