DocumentCode :
1101665
Title :
High temperature superconductor joins
Author :
Hilal, M.A. ; Huang, X. ; Lloyd, J.D.
Author_Institution :
Appl. Superconductivity Center, Wisconsin Univ., Madison, WI, USA
Volume :
27
Issue :
2
fYear :
1991
fDate :
3/1/1991 12:00:00 AM
Firstpage :
927
Lastpage :
930
Abstract :
High-temperature superconductor (HTS) joint characteristics are different from low-temperature superconductor (LTS) joint characteristics due to the anisotropy of HTS current density. The critical state model can be satisfied in LTS joints along most of the interface region for all possible current transfer distributions. A critical state model is assumed for the HTS in which the current density has different critical values in the transverse direction, along the c-axis, and in the longitudinal directions, in the a- b plane: and losses are generated in the superconductor at currents lower than the critical current. A two-dimensional model is used throughout the analysis. It is shown that superconductor losses are likely to be generated in the lead joint for HTS conductors in the case of low Jcr. This is due to limiting of the Jr to its critical value. This is not the case for an LTS conductor, since Jr is limited only by J c. For lap joints, the cross-sectional area for J r flow does not change, and large superconductor losses will be generated only if the average interface current is greater than Jct
Keywords :
contact resistance; critical currents; high-temperature superconductors; anisotropy; contact resistance; critical state model; current density; current transfer distributions; high temperature superconductor joints; interface current; lap joints; lead joint; longitudinal directions; superconductor losses; transverse direction; two-dimensional model; Anisotropic magnetoresistance; Conductors; Critical current; Current density; Geometry; High temperature superconductors; Laplace equations; Lead; Solid modeling; Superconductivity;
fLanguage :
English
Journal_Title :
Magnetics, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9464
Type :
jour
DOI :
10.1109/20.133330
Filename :
133330
Link To Document :
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