• DocumentCode
    1101880
  • Title

    Characterizing a Thermoelectric Module as Part of a Semiconductor Course Laboratory

  • Author

    Beaudoin, Philippe M. ; Audet, Yves ; Bendali, Abdelhalim

  • Author_Institution
    Electr. Eng. Dept., Ecole Polytech-nique de Montreal, Montreal, QC
  • Volume
    51
  • Issue
    2
  • fYear
    2008
  • fDate
    5/1/2008 12:00:00 AM
  • Firstpage
    282
  • Lastpage
    287
  • Abstract
    Thermoelectric modules (TEM), also known as Peltier modules, form an interesting topic to cover in an introductory semiconductor course. They provide insight on some important semiconductor principles, namely the Seebeck effect (the reverse of the Peltier effect) and thermal conductance. This paper presents a new methodology to characterize a TEM using a custom-designed test apparatus along with a simplified method for determining the TEM´s three key parameters: its Seebeck coefficient, its electrical resistance, and its thermal conductance. Results obtained using this methodology were validated by comparing the anticipated theoretical behavior of the TEM (using the experimentally determined parameters) to the actual results obtained in a vacuum environment. The suggested methodology has been evaluated by students and the results of this demonstrate its usefulness in an educational environment.
  • Keywords
    educational courses; electrical engineering education; electrical resistance; semiconductor course laboratory; thermal conductance; thermoelectric module; Cooling; Electric resistance; Infrared heating; Laboratories; Parameter extraction; Semiconductor materials; Testing; Thermal conductivity; Thermal resistance; Thermoelectricity; Peltier module; semiconductor laboratory course; thermoelectric module (TEM); thermoelectric parameters;
  • fLanguage
    English
  • Journal_Title
    Education, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9359
  • Type

    jour

  • DOI
    10.1109/TE.2007.910362
  • Filename
    4472091