DocumentCode :
1102011
Title :
Calculation of Integrated Circuit Yields
Author :
Whipple, W.L.
Author_Institution :
IEEE
Issue :
3
fYear :
1969
fDate :
3/1/1969 12:00:00 AM
Firstpage :
268
Lastpage :
268
Abstract :
This note describes the simple calculation required to obtain circuit yields from component yields for integrated circuits. A graph is presented to illustrate the high component yields required for MSI and LSI technology.
Keywords :
Circuit yields, component yields, integrated circuits.; Flip-flops; Integrated circuit reliability; Integrated circuit technology; Integrated circuit yield; Large scale integration; Manufacturing; Probability; Production; Yield estimation; Yttrium; Circuit yields, component yields, integrated circuits.;
fLanguage :
English
Journal_Title :
Computers, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9340
Type :
jour
DOI :
10.1109/T-C.1969.222640
Filename :
1671233
Link To Document :
https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=1102011
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