• DocumentCode
    1102037
  • Title

    Current lines and accurate contact current evaluation in 2-D numerical simulation of semiconductor devices

  • Author

    Palm, Erich ; Van de Wiele, Fernand

  • Author_Institution
    EUROTECHNIQUE -- Thomson Semiconductors, Rousset, France
  • Volume
    32
  • Issue
    10
  • fYear
    1985
  • fDate
    10/1/1985 12:00:00 AM
  • Firstpage
    2052
  • Lastpage
    2059
  • Abstract
    The conservation of the total current density in semiconductor devices implies that the current derives from a vector potential. The calculation of this current potential is a dual problem of the original device simulation problem. A simple and elegant discrete method is proposed for the 2-D case, which yields the current potential for a given, numerically calculated current density. The approach is based upon a least squares principle and is consistent with the assumptions leading to the discrete formulation of the semiconductor transport equations. Accurate values of the contact currents are obtained and a simple way to generate representations of current lines becomes available. The method has the advantage that it does not require any definition of paths for the integration of current files.
  • Keywords
    Boundary conditions; Construction industry; Current density; Current distribution; Lead compounds; Least squares methods; Numerical simulation; Partial differential equations; Semiconductor devices; Tellurium;
  • fLanguage
    English
  • Journal_Title
    Electron Devices, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9383
  • Type

    jour

  • DOI
    10.1109/T-ED.1985.22238
  • Filename
    1484984