DocumentCode
1102180
Title
Effects of Measurement Devices on Conducted Interference Levels
Author
Malack, J.A. ; Nicholson, J.R.
Author_Institution
Systems Products Division, IBM Corporation, Endicott, N.Y. 13760
Issue
2
fYear
1973
fDate
5/1/1973 12:00:00 AM
Firstpage
61
Lastpage
65
Abstract
Measurements of power line conducted interference voltages are commonly made throughout the 150 kHz to 30 MHz frequency range on military, industrial, and consumer equipment using line impedance stabilization networks (LISN) and, more recently, current probe techniques. This paper presents some brief background information concerning power line conducted interference measurements and the results of a study to assess the effects of LISN and current probe measurement devices on the level of measured conducted interference. A model is defined which facilitates prediction of the effects. The model concept allows the procedures described in this paper to be extended to equipment of other impedance definitions. A comparison of the calculated and empirical differences is made and suggests an analytical approach in sizing the effects upon the conducted interference levels.
Keywords
Current measurement; Defense industry; Frequency measurement; Impedance measurement; Interference; Military equipment; Power measurement; Predictive models; Probes; Voltage;
fLanguage
English
Journal_Title
Electromagnetic Compatibility, IEEE Transactions on
Publisher
ieee
ISSN
0018-9375
Type
jour
DOI
10.1109/TEMC.1973.303249
Filename
4090730
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