• DocumentCode
    1102180
  • Title

    Effects of Measurement Devices on Conducted Interference Levels

  • Author

    Malack, J.A. ; Nicholson, J.R.

  • Author_Institution
    Systems Products Division, IBM Corporation, Endicott, N.Y. 13760
  • Issue
    2
  • fYear
    1973
  • fDate
    5/1/1973 12:00:00 AM
  • Firstpage
    61
  • Lastpage
    65
  • Abstract
    Measurements of power line conducted interference voltages are commonly made throughout the 150 kHz to 30 MHz frequency range on military, industrial, and consumer equipment using line impedance stabilization networks (LISN) and, more recently, current probe techniques. This paper presents some brief background information concerning power line conducted interference measurements and the results of a study to assess the effects of LISN and current probe measurement devices on the level of measured conducted interference. A model is defined which facilitates prediction of the effects. The model concept allows the procedures described in this paper to be extended to equipment of other impedance definitions. A comparison of the calculated and empirical differences is made and suggests an analytical approach in sizing the effects upon the conducted interference levels.
  • Keywords
    Current measurement; Defense industry; Frequency measurement; Impedance measurement; Interference; Military equipment; Power measurement; Predictive models; Probes; Voltage;
  • fLanguage
    English
  • Journal_Title
    Electromagnetic Compatibility, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9375
  • Type

    jour

  • DOI
    10.1109/TEMC.1973.303249
  • Filename
    4090730