Title :
IIIB-1 Performance deviation of submicrometer MOSFET´s from scaling laws
Author :
Kume, Hideyuki ; Igura, Y. ; Kaga, T. ; Hagiwara, Tomomichi
fDate :
11/1/1985 12:00:00 AM
Keywords :
Delay effects; Delay estimation; Electrons; Laboratories; Performance evaluation; Power measurement; Power supplies; Solid state circuits; Voltage; Writing;
Journal_Title :
Electron Devices, IEEE Transactions on
DOI :
10.1109/T-ED.1985.22331
