DocumentCode

1103089

Title

IIIB-2 Channel length characterization of LDD MOSFET´s

Author

Sun, J.Y.C. ; Wordeman, M.R. ; Laux, S.E.

Volume

32

Issue

11

fYear

1985

fDate

11/1/1985 12:00:00 AM

Firstpage

2536

Lastpage

2537

Keywords

Algorithm design and analysis; Analytical models; Data mining; Electrons; Error analysis; Geometry; MOSFET circuits; Solid modeling; Solid state circuits; Sun;

fLanguage

English

Journal_Title

Electron Devices, IEEE Transactions on

Publisher

ieee

ISSN

0018-9383

Type

jour

DOI

10.1109/T-ED.1985.22332

Filename

1485078