DocumentCode
1103289
Title
Coupled electrothermal modeling of microheaters using SPICE
Author
Swart, Nicholas R. ; Nathan, Arokia
Author_Institution
Dept. of Electr. & Comput. Eng., Waterloo Univ., Ont., Canada
Volume
41
Issue
6
fYear
1994
fDate
6/1/1994 12:00:00 AM
Firstpage
920
Lastpage
925
Abstract
In this paper,,we report a novel simulation approach that computes both the transient and steady state electrothermal behavior in integrated circuit (IC) compatible thermally isolated microheaters. The resulting distribution of heat, current density and temperature, as well as the electrical terminal behavior have been obtained for realistic device structures. The results are based on a two-dimensional solution of the coupled system of partial differential equations that govern both electrical and heat transport in the device. Unlike standard numerical approaches for coupled systems, our technique is based on the behavioural models, available in most commercial circuit simulators (e.g., HSPICE), that allow synthesis of complex, nonlinear, and coupled circuit elements. The simulation results are in excellent agreement with measurement data of steady state and transient terminal characteristics, obtained under conditions of vacuum. We note that this modeling approach allows concurrent simulation (and subsequent optimization) of the performance of both the control electronics as well as the thermal element(s), within the same IC design environment
Keywords
SPICE; current density; partial differential equations; semiconductor device models; simulation; HSPICE; SPICE; behavioural models; commercial circuit simulators; concurrent simulation; coupled electrothermal modeling; coupled system; current density; current temperature; electrical terminal behavior; heat; integrated circuit compatible thermally isolated microheaters; measurement data; microheaters; nonlinear coupled circuit element synthesis; optimization; partial differential equations; realistic device structures; simulation approach; steady state electrothermal behavior; transient electrothermal behavior; two-dimensional solution; Circuit simulation; Computational modeling; Coupling circuits; Current density; Electrothermal effects; Integrated circuit modeling; Resistance heating; SPICE; Steady-state; Temperature distribution;
fLanguage
English
Journal_Title
Electron Devices, IEEE Transactions on
Publisher
ieee
ISSN
0018-9383
Type
jour
DOI
10.1109/16.293302
Filename
293302
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