DocumentCode

1103294

Title

IVB-5 Degradation behavior of dynamically stressed n-MOSFET´s

Author

Weber, W.

Volume

32

Issue

11

fYear

1985

fDate

11/1/1985 12:00:00 AM

Firstpage

2543

Lastpage

2544

Keywords

Charge carrier processes; Charge transfer; Degradation; Electron devices; Electron emission; Hydrogen; Instruments; MOSFET circuits; Passivation; Stress;

fLanguage

English

Journal_Title

Electron Devices, IEEE Transactions on

Publisher

ieee

ISSN

0018-9383

Type

jour

DOI

10.1109/T-ED.1985.22350

Filename

1485096