DocumentCode :
110345
Title :
Parametric Measurements of Switching Losses of Insulated Gate Bipolar Transistor in Pulsed Power Applications
Author :
Strowitzki, Claus Fritz
Author_Institution :
MLase AG Dev., Germering, Germany
Volume :
41
Issue :
10
fYear :
2013
fDate :
Oct. 2013
Firstpage :
2614
Lastpage :
2618
Abstract :
Insulated gate bipolar transistors (IGBTs) are the workhorse in power electronics. Due to recent improvements in IGBTs, they also find many applications in the field of pulsed power. The switching losses of an IGBT are normally given from the supplier, but not from typical converter applications. These data are not valid for pulsed power applications. In this paper, parametric measurements of turn-on losses are shown for IGBTs in a typical pulsed power application.
Keywords :
insulated gate bipolar transistors; measurement systems; power electronics; pulsed power technology; IGBT; converter applications; insulated gate bipolar transistors; parametric measurements; power electronics; pulsed power applications; switching losses; turn-on losses; Current measurement; Insulated gate bipolar transistors; Logic gates; Loss measurement; Magnetic cores; Switching loss; Temperature measurement; Component; insulated gate bipolar transistor (IGBT); switching losses; turn-on losses;
fLanguage :
English
Journal_Title :
Plasma Science, IEEE Transactions on
Publisher :
ieee
ISSN :
0093-3813
Type :
jour
DOI :
10.1109/TPS.2013.2251678
Filename :
6488868
Link To Document :
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