Title :
The processing and properties of high Tc thick films
Author :
Button, T.W. ; Alford, N.M. ; Wellhofer, F. ; Shields, T.C. ; Abell, J.S. ; Day, M.
Author_Institution :
ICI Adv. Mater., Runcorn, UK
fDate :
3/1/1991 12:00:00 AM
Abstract :
The influence of processing conditions on the microstructure and properties of YBa2Cu3Ox thick films on yttria-stabilized zirconia substrates is reported. Films processed below the peritectic temperature are fine grained, exhibit little preferred orientation, and generally have low critical currents. Above the peritectic temperature, the morphology changes dramatically and large, highly textured, spherulitic crystals are observed, with an associated increase in critical current and an improved Tc. Properties in these materials are generally much better than those of bulk YBa2Cu3Ox . The relationship between microstructure and properties is shown to be complex. The influence of silver additions to the films is examined, and examples are given of thick-film devices which are being evaluated. Thick-film devices under evaluation include flux transformers, TE011 cavities, coaxial and helical resonators, microstrip resonators, current limiters, and shields
Keywords :
barium compounds; critical current density (superconductivity); high-temperature superconductors; materials preparation; thick films; yttrium compounds; TE011 cavities; YBa2Cu3Ox thick films; ZrO2-Y2O3; coaxial resonators; current limiters; fine grained; flux transformers; helical resonators; high Tc thick films; high temperature superconductor; low critical currents; microstrip resonators; microstructure; morphology; peritectic temperature; processing conditions; properties; shields; spherulitic crystals; Critical current; Crystalline materials; Crystals; Microstructure; Morphology; Silver; Tellurium; Temperature; Thick films; Transformers;
Journal_Title :
Magnetics, IEEE Transactions on
