DocumentCode
1103715
Title
Reliability of semiconductor lasers for undersea optical transmission systems
Author
Fujita, Osamu ; Nakano, Yoshinori ; Iwane, Genzo
Author_Institution
NTT Atsugi Electrical Communication Laboratories, Kanagawa, Japan
Volume
32
Issue
12
fYear
1985
fDate
12/1/1985 12:00:00 AM
Firstpage
2603
Lastpage
2608
Abstract
The reliability of laser diodes developed for undersea optical transmission systems is analyzed. Up to 1000 device samples of two types (DC-PBH and VSB) are used. An aging test with constant light power operation of 5 mW is carried out at 10, 50, and 70°C for 10 000 h. The median lifetime at 10°C is conservatively estimated to be 1.6 × 106hours. Failure rate at 10°C is estimated at 250 FIT´s at 25 years of service for the wear-out failure mode and at less than 50 FIT´s for the random failure mode with a sufficient margin. Furthermore, it is determined that reliability can be further improved by selection of long-life lasers through an additional third step screening aging.
Keywords
Aging; Diode lasers; Inorganic materials; Life estimation; Lifetime estimation; Optical devices; Power system reliability; Semiconductor device reliability; Semiconductor lasers; Testing;
fLanguage
English
Journal_Title
Electron Devices, IEEE Transactions on
Publisher
ieee
ISSN
0018-9383
Type
jour
DOI
10.1109/T-ED.1985.22390
Filename
1485136
Link To Document