Title : 
Reliability of semiconductor lasers for undersea optical transmission systems
         
        
            Author : 
Fujita, Osamu ; Nakano, Yoshinori ; Iwane, Genzo
         
        
            Author_Institution : 
NTT Atsugi Electrical Communication Laboratories, Kanagawa, Japan
         
        
        
        
        
            fDate : 
12/1/1985 12:00:00 AM
         
        
        
        
            Abstract : 
The reliability of laser diodes developed for undersea optical transmission systems is analyzed. Up to 1000 device samples of two types (DC-PBH and VSB) are used. An aging test with constant light power operation of 5 mW is carried out at 10, 50, and 70°C for 10 000 h. The median lifetime at 10°C is conservatively estimated to be 1.6 × 106hours. Failure rate at 10°C is estimated at 250 FIT´s at 25 years of service for the wear-out failure mode and at less than 50 FIT´s for the random failure mode with a sufficient margin. Furthermore, it is determined that reliability can be further improved by selection of long-life lasers through an additional third step screening aging.
         
        
            Keywords : 
Aging; Diode lasers; Inorganic materials; Life estimation; Lifetime estimation; Optical devices; Power system reliability; Semiconductor device reliability; Semiconductor lasers; Testing;
         
        
        
            Journal_Title : 
Electron Devices, IEEE Transactions on
         
        
        
        
        
            DOI : 
10.1109/T-ED.1985.22390