DocumentCode
1103937
Title
Guest Editors´ Introduction: The State of the Art in Nanoscale CAD
Author
Lombardi, Fabrizio ; Metra, Cecilia
Author_Institution
Northeastern University
Volume
24
Issue
4
fYear
2007
Firstpage
302
Lastpage
303
Abstract
Because of very small feature size, high integration levels, and innovative computational features, new concerns are emerging regarding the implementation of computing systems, leading to increased interest in nanoscale technology. Continued scaling of current top-down trends suggests the need for features measured in the nanometer range. As new techniques to synthesize nanostructures from the bottom up emerge, design practice will require CAD as a framework. Moreover, new tools are necessary for VLSI so that designers can assess the different capabilities for assembling devices into circuits and systems. The design of nanoscale systems is inherently complex and must consider phenomena such as statistical and probabilistic behavior, as well as reduction of parasitic effects. Tools are a necessity to ensure that emerging technologies will move into industry for full commercialization. The convergence of such issues will make CAD at the nanoscale level a vibrant, challenging topic for many years to come. This special section presents a timely account of the state of the art in this area, with emphasis on tools and related frameworks.
Keywords
Atomic measurements; Circuit faults; Circuit synthesis; Circuit testing; Current measurement; Design automation; Nanoscale devices; Semiconductor nanostructures; Space technology; Very large scale integration; CAD; VLSI; feature size; nanostructures; nanotechnology;
fLanguage
English
Journal_Title
Design & Test of Computers, IEEE
Publisher
ieee
ISSN
0740-7475
Type
jour
DOI
10.1109/MDT.2007.133
Filename
4293173
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