Title :
Experimental design of exit wave reconstruction from a transmission electron microscope defocus series
Author :
Miedema, Martijn A O ; Van den Bos, Adriaan ; Buist, A.H.
Author_Institution :
Dept. of Appl. Phys., Delft Univ. of Technol., Netherlands
fDate :
4/1/1994 12:00:00 AM
Abstract :
Recently published methods reconstruct the complex exit wave of the specimen in a transmission electron microscope by combining a number of images recorded at different defocus values. An expression is derived for the variance of the reconstructed wave as a function of the experimental parameters that can be freely chosen. It is shown how these parameters can be used for experimental design, that is, for minimizing the variance of the reconstructed wave
Keywords :
electron microscopy; electron optics; fast Fourier transforms; image reconstruction; linearisation techniques; transfer functions; transmission electron microscopes; complex exit wave; defocus series; defocus values; error sources; exit wave reconstruction; experimental parameters; image reconstruction; nonlinear imaging model; reconstructed wave; transmission electron microscope; Design for experiments; Electron microscopy; Equations; Fourier transforms; Frequency; Image reconstruction; Instrumentation and measurement; Optical microscopy; Transfer functions; Transmission electron microscopy;
Journal_Title :
Instrumentation and Measurement, IEEE Transactions on
