DocumentCode :
1104235
Title :
An analysis of intersecting diffused channel waveguides
Author :
Feit, M.D. ; Fleck, Joseph A., Jr.
Author_Institution :
University of California, Livermore, CA, USA
Volume :
21
Issue :
11
fYear :
1985
fDate :
11/1/1985 12:00:00 AM
Firstpage :
1799
Lastpage :
1805
Abstract :
The coupling characteristics of intersecting diffused channel waveguides are computed for realistic three-dimensional diffusion profiles by means of the propagating beam method (PBM). Both TE and TM polarizations are treated for waveguides formed on z -cut LiNbO3. Good agreement between computed and previously reported measured results is found for the TE polarization. Agreement between computed and measured results is not as good for the TM polarization. This is explained by the fact that the applicable 2Del\\tan -waveguide supports four modes, which should make coupling characteristics very sensitive to input conditions.
Keywords :
Optical strip waveguide couplers; Crystals; Directional couplers; Integrated optics; Lithium niobate; Optical coupling; Optical waveguides; Polarization; Tellurium; Waveguide junctions; Waveguide transitions;
fLanguage :
English
Journal_Title :
Quantum Electronics, IEEE Journal of
Publisher :
ieee
ISSN :
0018-9197
Type :
jour
DOI :
10.1109/JQE.1985.1072587
Filename :
1072587
Link To Document :
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