Comments on "Small geometry MOS transistor capacitance measurement method using simple on-chip circuits"

A careful study of the recent letter published in this journal by Oristian et al. [1] shows that their measurement arrangement cannot be used to measure the internodal capacitances of a MOSFET. Their measurement arrangement works only under their specified conditions which can be checked by the quasi-static CV method. However, their measurement arrangement cannot be extended to other conditions due to their fundamentally wrong assumption.